Equipment

Main Content

FEI Quanta FEG 450 SEM with EDS detectors

fei quanta

High vacuum

  • 0.8 nm at 30 kV (STEM)
  • 1.0 nm at 30 kV (SE)
  • 2.5 nm at 30 kV (BSE)
  • 3.0 nm at 1 kV (SE)

High vacuum with beam deceleration option

  • 3.0 nm at 1 kV (BD mode + BSED)
  • 2.3 nm at 1 kV (BD mode + ICD)
  • 3.1 nm at 200 V (BD mode + ICD)

Low vacuum

  • 1.4 nm at 30 kV (SE)
  • 2.5 nm at 30 kV (BSE)
  • 3.0 nm at 3 kV (SE)

Extended vacuum mode (ESEM)
1.4 nm at 30 kV (SE)
Magnification: 6 to 1,000,000x

SEM Detectors:
ELS, BS, EDS, ETD, LFD and STEM

For wet samples:
Environment-SEM and STEM


Hitachi H-7650 TEM

hitachi h-7650

HC mode
ZOOM-1 200× to 200,000×
ZOOM-2 200× to 200,000×
DIFF 0.05 m to 8.0 m
F-Zoom 200× to 200,000× (option)
F-DIFF 0.05 m to 8.0 m (option)

HR mode
ZOOM-1 4,000× to 600,000×
ZOOM-2 4,000× to 600,000×
DIFF 0.05 m to 2.0 m
F-Zoom 4,000× to 600,000× (option)
F-DIFF 0.05 m to 2.0 m (option)

LOW MAG mode 50× to 1,000×


Park Scientific-Auto Probe CP Atomic Force Microscope

atomic force microscope

atomic force microscope


Denton Sputter Coater

denton sputter coater

denton sputter coater


Denton Evaporator

evaporator


Leica Ultra Microtome

microtome


Leica Optical Microscope

microscope


Critical Point Dryer

dryer


Poster Printing

poster printing