Equipment
Our Equipment
FEI Quanta FEG 450 SEM with EDS detectors
FEI Quanta FEG 450 SEM with EDS detectors
High vacuum
- 0.8 nm at 30 kV (STEM)
- 1.0 nm at 30 kV (SE)
- 2.5 nm at 30 kV (BSE)
- 3.0 nm at 1 kV (SE)
High vacuum with beam deceleration option
- 3.0 nm at 1 kV (BD mode + BSED)
- 2.3 nm at 1 kV (BD mode + ICD)
- 3.1 nm at 200 V (BD mode + ICD)
Low vacuum
- 1.4 nm at 30 kV (SE)
- 2.5 nm at 30 kV (BSE)
- 3.0 nm at 3 kV (SE)
- 1.4 nm at 30 kV (SE)
- Magnification: 6 to 1,000,000x
- ELS, BS, EDS, ETD, LFD and STEM
Environment-SEM and STEM
Hitachi H-7650 TEM
Hitachi H-7650 TEM
HC mode
- ZOOM-1 200× to 200,000×
- ZOOM-2 200× to 200,000×
- DIFF 0.05 m to 8.0 m
- F-Zoom 200× to 200,000× (option)
- F-DIFF 0.05 m to 8.0 m (option)
- ZOOM-1 4,000× to 600,000×
- ZOOM-2 4,000× to 600,000×
- DIFF 0.05 m to 2.0 m
- F-Zoom 4,000× to 600,000× (option)
- F-DIFF 0.05 m to 2.0 m (option)
Low Mag mode 50× to 1,000×
Leica Confocal Inverted Microscope, Model: Leica TCS SP5
Leica Confocal Inverted Microscope, Model: Leica TCS SP5
This instrument has six lasers and two PMT's. The microscope is controlled by a Leica software. A new high-speed camera is added to the microscope which can acquire images upto 25,000 fps. This instrument is available for use. Rate is $ 40/hour
Bruker Dimension Icon V Atomic Force microscope
Bruker Dimension Icon V Atomic Force microscope
Denton Sputter Coater
Denton Sputter Coater
Denton Evaporator
Denton Evaporator
Leica Ultra Microtome
Leica Ultra Microtome
Critical Point Dryer
Critical Point Dryer
Poster Printing
Poster Printing
