Equipment

FEI Quanta FEG 450 SEM with EDS detectors

High vacuum

0.8 nm at 30 kV (STEM)
1.0 nm at 30 kV (SE)
2.5 nm at 30 kV (BSE)
3.0 nm at 1 kV (SE)

High vacuum with beam deceleration option

3.0 nm at 1 kV (BD mode + BSED)
2.3 nm at 1 kV (BD mode + ICD)
3.1 nm at 200 V (BD mode + ICD)

Low vacuum

1.4 nm at 30 kV (SE)
2.5 nm at 30 kV (BSE)
3.0 nm at 3 kV (SE)

Extended vacuum mode (ESEM)
1.4 nm at 30 kV (SE)
Magnification: 6 to 1,000,000x

SEM Detectors:
ELS, BS, EDS, ETD, LFD and STEM

For wet samples:
Environment-SEM and STEM

Hitachi H-7650 TEM

hitachi h-7650

HC mode
ZOOM-1 200× to 200,000×
ZOOM-2 200× to 200,000×
DIFF 0.05 m to 8.0 m
F-Zoom 200× to 200,000× (option)
F-DIFF 0.05 m to 8.0 m (option)

HR mode
ZOOM-1 4,000× to 600,000×
ZOOM-2 4,000× to 600,000×
DIFF 0.05 m to 2.0 m
F-Zoom 4,000× to 600,000× (option)
F-DIFF 0.05 m to 2.0 m (option)

LOW MAG mode 50× to 1,000×

Leica Confocal Inverted Microscope, Model: Leica TCS SP5

This instrument has six lasers and two PMT's. The microscope is controlled by a Leica software. A new high-speed camera is added to the microscope which can acquire images upto 25,000 fps. This instrument is available for use. Rate is $ 40/hour

Park Scientific-Auto Probe CP Atomic Force Microscope